Title
Nanometer Cmos
Abstract
This book gives a comprehensive overview of all important issues concerning modern Si MOSFETs. It covers the principles of MOSFET operation, theory and scaling issues and an in-depth discussion of nanometer MOSFETs. Both classical nanometer MOSFETs and non-classical MOSFET concepts, which receive little coverage in textbooks, are treated in detail. The device structures, merits and drawbacks of MOSFET concepts, such as strained Si MOSFETs, ultra-thin-body SOI MOSFETs and multiple-gate MOSFETs (FinFETs, tri-gate MOSFETs) are presented. An entire chapter is devoted to the emerging and rapidly growing field of RF MOSFETs/RF CMOS, and the discussion extends to the important future trends in nanometer CMOS technology and the problems and limits of scaling. © 2010 by Pan Stanford Publishing Pte. Ltd. All rights reserved.
Publication Date
2-1-2010
Publication Title
Nanometer CMOS
Number of Pages
-
Document Type
Article; Book Chapter
Personal Identifier
scopus
DOI Link
https://doi.org/10.4032/9789814241229
Copyright Status
Unknown
Socpus ID
78650022025 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/78650022025
STARS Citation
Schwierz, Frank; Wong, Hei; and Liou, Juin J., "Nanometer Cmos" (2010). Scopus Export 2010-2014. 1548.
https://stars.library.ucf.edu/scopus2010/1548