Title
Measurement Of The Fsr Of A High Finesse Etalon With 2.5 Khz Accuracy Using A Narrow-Linewidth Frequency Swept Laser
Abstract
Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.
Publication Date
1-1-2010
Publication Title
Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/cleo.2010.jwa42
Copyright Status
Unknown
Socpus ID
77957574057 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77957574057
STARS Citation
Mandridis, D.; Bagnell, M.; Ozdur, I.; and Delfyett, P. J., "Measurement Of The Fsr Of A High Finesse Etalon With 2.5 Khz Accuracy Using A Narrow-Linewidth Frequency Swept Laser" (2010). Scopus Export 2010-2014. 1717.
https://stars.library.ucf.edu/scopus2010/1717