Title

Measurement Of The Fsr Of A High Finesse Etalon With 2.5 Khz Accuracy Using A Narrow-Linewidth Frequency Swept Laser

Abstract

Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.

Publication Date

1-1-2010

Publication Title

Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/cleo.2010.jwa42

Socpus ID

77957574057 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/77957574057

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