Title
Femtosecond Dispersion Measurements Of 1.3 Μm Quantum Dot Semiconductor Optical Amplifier
Abstract
Spectral interferometry is used to measure the dispersion of a quantum dot semiconductor optical amplifier under various injection current values in the wavelength range of 1200 to 1340 nm, spanning ground and first excited state. © 2010 Optical Society of America.
Publication Date
1-1-2010
Publication Title
Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/cleo.2010.cthl5
Copyright Status
Unknown
Socpus ID
77957561589 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77957561589
STARS Citation
Bagnell, M.; Davila-Rodriguez, J.; Ardey, A.; and Delfyett, P. J., "Femtosecond Dispersion Measurements Of 1.3 Μm Quantum Dot Semiconductor Optical Amplifier" (2010). Scopus Export 2010-2014. 1720.
https://stars.library.ucf.edu/scopus2010/1720