Title

Linear Systems Formulation Of Image Analysis In The Presence Of Both Aberrations And Surface Scatter

Keywords

Aberrations; Angle spread function; BRDF; Image Analysis; Linear systems theory; Surface Scatter

Abstract

Image analysis in the presence of surface scatter due to residual optical fabrication errors is often perceived to be complicated, non-intuitive and computationally intensive. The linear systems formulation of surface scatter phenomena has resulted in the development of an angle spread function that is completely analogous to the point spread function in modern image formation theory; i.e., surface scatter can be treated very similar to conventional wavefront aberrations. For multi-element imaging systems degraded by both surface scatter and aberrations, the composite point spread function is obtained in explicit form in terms of convolutions of the geometrical point spread function and the angle spread functions of the individual surfaces of the imaging system. The approximations and assumptions in this formulation are discussed in detail, and the result is compared to the irradiance distribution obtained using commercial software for the case of a two-mirror EUV telescope. The two results are virtually identical. © 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

Publication Date

11-8-2011

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

8128

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.910930

Socpus ID

80355123709 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/80355123709

This document is currently not available here.

Share

COinS