Title
A New Method To Evaluate Effectiveness Of Cdm Esd Protection
Abstract
A new methodology for evaluating the effectiveness of CDM protection is presented. VFTLP measurements are performed on structures composed of an ESD protection device in parallel with a gate monitor device; a MOS transistor or inverter. Parametric shifts in threshold voltage, VTH, as well as drain saturation current, IDD, of the MOS monitor device are measured to continuously gauge the extent of the damage resulted from a CDM-like fast transient.
Publication Date
12-24-2010
Publication Title
Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
78650350707 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/78650350707
STARS Citation
Zhou, Yuanzhong; Hajjar, Jean Jacques; Ellis, David F.; Olney, Andrew H.; and Liou, Juin J., "A New Method To Evaluate Effectiveness Of Cdm Esd Protection" (2010). Scopus Export 2010-2014. 208.
https://stars.library.ucf.edu/scopus2010/208