Title
Characterization Of Soi Microrings Using Ir Imaging
Abstract
We demonstrate a non-invasive diagnostic method of quantitative infrared (IR) imaging, applied here to a series cascade of microring resonators fabricated in silicon-on-insulator. The IR images contain information on the otherwise inaccessible individual through-ports and the resonators themselves, providing coupling, loss and intensity-enhancement parameters for the individual rings. © 2009 Optical Society of America.
Publication Date
10-11-2010
Publication Title
Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
77957569826 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77957569826
STARS Citation
Cooper, Michael L.; Gupta, Greeshma; Park, Jung S.; Schneider, Mark A.; and Divliansky, Ivan B., "Characterization Of Soi Microrings Using Ir Imaging" (2010). Scopus Export 2010-2014. 364.
https://stars.library.ucf.edu/scopus2010/364