Title
Domain Of Validity Of The Equation For Total Integrated Scatter (Tis)
Keywords
Bandlimited relevant surface roughness; Scattering from rough surfaces; Surface power spectral density (PSD) function; Total integrated scatter
Abstract
The analytical expression for total integrated scatter (defined as diffuse reflectance divided by total reflectance) has been around for almost six decades TIS= 1-exp[-(4πcosθi σ/λ)2] Most surface scatter analysts now realize that the expression is ambiguous unless spatial frequency band-limits are specified for the rms roughness, σ, in the expression. However, there still exists uncertainty about the domain of validity of the expression with regard to both surface characteristics and incident angle. In this paper we will quantitatively illustrate this domain of validity for both Gaussian and fractal one-dimensional surfaces as determined by the rigorous integral equation method (method of moments) of electromagnetic theory. Two dimensional error maps will be used to illustrate the domain of validity as a function of surface characteristics and incident angle. Graphical illustrations comparing the TIS predictions of several approximate surface scatter theories will also be presented. © 2012 SPIE.
Publication Date
12-1-2012
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
8495
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.930566
Copyright Status
Unknown
Socpus ID
84872577602 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84872577602
STARS Citation
Harvey, James E. and Choi, Narak, "Domain Of Validity Of The Equation For Total Integrated Scatter (Tis)" (2012). Scopus Export 2010-2014. 3980.
https://stars.library.ucf.edu/scopus2010/3980