Title

Domain Of Validity Of The Equation For Total Integrated Scatter (Tis)

Keywords

Bandlimited relevant surface roughness; Scattering from rough surfaces; Surface power spectral density (PSD) function; Total integrated scatter

Abstract

The analytical expression for total integrated scatter (defined as diffuse reflectance divided by total reflectance) has been around for almost six decades TIS= 1-exp[-(4πcosθi σ/λ)2] Most surface scatter analysts now realize that the expression is ambiguous unless spatial frequency band-limits are specified for the rms roughness, σ, in the expression. However, there still exists uncertainty about the domain of validity of the expression with regard to both surface characteristics and incident angle. In this paper we will quantitatively illustrate this domain of validity for both Gaussian and fractal one-dimensional surfaces as determined by the rigorous integral equation method (method of moments) of electromagnetic theory. Two dimensional error maps will be used to illustrate the domain of validity as a function of surface characteristics and incident angle. Graphical illustrations comparing the TIS predictions of several approximate surface scatter theories will also be presented. © 2012 SPIE.

Publication Date

12-1-2012

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

8495

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.930566

Socpus ID

84872577602 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84872577602

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