Title

Discrimination Of Field Components In Optical Probe Microscopy

Abstract

We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity. © 2012 Optical Society of America.

Publication Date

9-1-2012

Publication Title

Optics Letters

Volume

37

Issue

17

Number of Pages

3606-3608

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/OL.37.003606

Socpus ID

84865788115 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84865788115

This document is currently not available here.

Share

COinS