Title

Electron Beam Induced Surface Morphology Changes Of Ceo2 Nanocrystals: An In-Situ Aberration Corrected Tem Study

Keywords

Aberration corrected TEM; Ceria nanoparticles; In-situ TEM

Abstract

Hydrothermally prepared ceria cuboid nanoparticles were imaged in a 300 keV aberration corrected TEM to study the instabilities of different facets of nanoscale ceria at the atomic level. Real-time video recording at a rate of 30fps enables to closely monitor and quantify individual atomic movements. It is proposed to use quantification of electron beam induced cation movements and reconstructions as a novel probe for measurements of oxygen surface activity with nm-scale resolution, with applications in e.g. catalysis. © 2012 IEEE.

Publication Date

11-22-2012

Publication Title

Proceedings of the IEEE Conference on Nanotechnology

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/NANO.2012.6322226

Socpus ID

84869194025 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84869194025

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