Title
Photovoltaic Module Reliability Studies At The Florida Solar Energy Center
Keywords
A-Si:H; High voltage bias; Photovoltaic; PVUSA regression
Abstract
The accelerated tests currently carried out on PV modules reduce the infant mortality as well as improve the production techniques during the manufacture of PV modules. However, they do not completely duplicate the real world operating conditions of PV modules. Hence it is essential to deploy PV modules in the field for extended period of time in order to estimate the degradation, if any, as well as to elucidate the degradation mechanisms. Moreover, PV modules should be tested by specially designed tests in harsh climates. In this paper some of the results obtained on a-Si:H modules from various US companies is discussed. © 2010 IEEE.
Publication Date
10-20-2010
Publication Title
IEEE International Reliability Physics Symposium Proceedings
Number of Pages
306-311
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/IRPS.2010.5488813
Copyright Status
Unknown
Socpus ID
77957902552 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77957902552
STARS Citation
Dhere, Neelkanth G.; Pethe, Shirish A.; and Kaul, Ashwani, "Photovoltaic Module Reliability Studies At The Florida Solar Energy Center" (2010). Scopus Export 2010-2014. 485.
https://stars.library.ucf.edu/scopus2010/485