Title
Beam Deflection For Time-Resolved Measurement Of Nonlinear Refraction
Abstract
We modify the photothermal beam deflection technique for the sensitive measurement of ultrafast nonlinear refraction (λ/5000 sensitivity to nonlinearly-induced phase changes). This allows direct measurement of the temporal dynamics and polarization dependence of nonlinear refraction. © OSA 2013.
Publication Date
12-1-2013
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
84898072065 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84898072065
STARS Citation
Ferdinandus, Manuel R.; Hu, Honghua; Reichert, Matthew; Hagan, David J.; and Van Stryland, Eric W., "Beam Deflection For Time-Resolved Measurement Of Nonlinear Refraction" (2013). Scopus Export 2010-2014. 5788.
https://stars.library.ucf.edu/scopus2010/5788