Title

Evaluation Of Electrostatic Discharge (Esd) Characteristics For Bottom Contact Organic Thin Film Transistor

Keywords

bottom contact; Electrostatic discharge (ESD); failure current It2; leakage current; OTFT; TLP; top-contact

Abstract

Electrostatic discharge (ESD) performance of the bottom-contact organic thin-film transistors (OTFT) is investigated experimentally for the first time using the transmission line pulsing technique. The failure currents and leakage currents of OTFTs having different channel lengths and finger structures are characterized. Physical insights and measured data are offered to explain the failure of these devices at relatively low ESD stress level. © 2013 IEEE.

Publication Date

12-23-2013

Publication Title

2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/EDSSC.2013.6628187

Socpus ID

84890487599 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84890487599

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