Title

Simultaneous Measurement Of Tracer And Interdiffusion Coefficients: An Isotopic Phenomenological Diffusion Formalism For The Binary Alloy

Keywords

diffusion; SIMS; theoretical

Abstract

In this paper, a new development of the classic Onsager phenomenological formalism is derived using relations based on linear response theory. The development concerns the correct description of the fluxes of the atomic isotopes. The resulting expressions in the laboratory frame are surprisingly simple and consist of terms coming from the standard interdiffusion expressions and from Ficks first law, where the tracer diffusion coefficient is involved thus providing a better understanding of the relationship between the two approaches - Ficks first law and the Onsager phenomenological formalism. From an experimental application perspective, the new development is applied to the binary alloy case. The formalism provides the means to obtain the interdiffusion coefficient and tracer diffusion coefficients simultaneously from analysis of the interdiffusion composition profiles in a single experiment. © 2013 Copyright Taylor and Francis Group, LLC.

Publication Date

9-1-2013

Publication Title

Philosophical Magazine

Volume

93

Issue

26

Number of Pages

3515-3526

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1080/14786435.2013.813982

Socpus ID

84885023542 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84885023542

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