Title

Experimental Evaluation Of Hot Electron Reliability On Differential Clapp-Vco

Abstract

This paper studies the hot-carrier stressed property of a series-tuned all-n core voltage controlled oscillator (VCO). A differential Clapp-VCO has been successfully implemented in the 0.13 m CMOS process and it uses a series-tuned resonator. Two single ended nMOS-core Clapp-VCOs are used to form a differential VCO by the aid of a cross-coupled nMOS pair and a transformer. The measured results show that the fresh Clapp-VCO operates from 18.8 to 22.2 GHz and hot-carrier stressed experimental data indicate that the damage increases the oscillation frequency and degrades the phase noise of oscillator. Mixed-mode simulation results are used to show the hot-carrier physics to the circuit. © 2012 Elsevier Ltd. All rights reserved.

Publication Date

2-1-2013

Publication Title

Microelectronics Reliability

Volume

53

Issue

2

Number of Pages

254-258

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1016/j.microrel.2012.08.004

Socpus ID

84873721871 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84873721871

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