Title
Intrinsic Detection Of Scattering Phase With Near-Field Scanning Optical Microscope
Abstract
We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM. © 2010 Optical Society of America.
Publication Date
7-15-2010
Publication Title
Optics Letters
Volume
35
Issue
14
Number of Pages
2463-2465
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/OL.35.002463
Copyright Status
Unknown
Socpus ID
77954983356 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77954983356
STARS Citation
Kohlgraf-Owens, Dana C.; Haefner, David; Sukhov, Sergey; and Dogariu, Aristide, "Intrinsic Detection Of Scattering Phase With Near-Field Scanning Optical Microscope" (2010). Scopus Export 2010-2014. 719.
https://stars.library.ucf.edu/scopus2010/719