Title

Portable Piezospectroscopy System: Non-Contact In-Situ Stress Sensing Through High Resolution Photo-Luminescent Mapping

Keywords

Data processing methods; Detection of defects; Spectrometers

Abstract

Through the piezospectroscopic effect, certain photo-luminescent materials, once excited with a laser, produce spectral emissions which are sensitive to the stress or strain that the material experiences. A system that utilizes the piezospectroscopic effect for non-contact stress detection over a material's surface can capture important information on the evolution of mechanical response under various conditions. Therefore, the components necessary for piezospectroscopic mapping and analysis have now been integrated into a versatile and transportable system that can be used with photo-luminescent materials in any load frame or on a variety of structures. This system combines compact hardware components such as a portable laser source, fiber optics, spectrograph, charge-coupled device (CCD), and an X-Y-Z stage (with focusing capabilities) with a series of data analysis algorithms capable of analyzing and outputting high resolution photo-luminescent (PL) maps on-site. Through a proof of concept experiment using a compressed polycrystalline alumina sample with sharp machined corners, this system successfully captured high resolution PL maps with a step size of 28.86μm/pixel and located high stress concentrations in critical areas, which correlated closely with the results of a finite element model. This work represents an important step in advancing the portability of piezospectroscopy for in-situ and non-contact stress detection. The instrumentation developed here has strong implications for the future of non-destructive evaluation and non-invasive structural health monitoring.

Publication Date

11-1-2014

Publication Title

Journal of Instrumentation

Volume

9

Issue

11

Number of Pages

-

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1088/1748-0221/9/11/P11005

Socpus ID

84914103454 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84914103454

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