Title
Reconstructing Small Perturbations In Electrical Admittivity At Low Frequencies
Keywords
electrical impedance tomography; frequency differential; small perturbation
Abstract
We present a method to recover small perturbations from constants in electrical conductivity σ and relative (to the air's) permittivity of a body, from electrical measurements at low frequencies at the boundary. The method is based on the asymptotic expansion of the frequency differential of the Neumann-to-Dirichlet map with respect to both frequency and perturbation size. To show its feasibility, we implement the method on two numerical experiments for a complete electrode model. © 2014 IOP Publishing Ltd.
Publication Date
3-1-2014
Publication Title
Inverse Problems
Volume
30
Issue
3
Number of Pages
-
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1088/0266-5611/30/3/035006
Copyright Status
Unknown
Socpus ID
84894540173 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84894540173
STARS Citation
Kim, Sungwhan and Tamasan, Alexandru, "Reconstructing Small Perturbations In Electrical Admittivity At Low Frequencies" (2014). Scopus Export 2010-2014. 8448.
https://stars.library.ucf.edu/scopus2010/8448