Title

Multi-Frequency Near-Field Scanning Optical Microscopy

Keywords

atomic force microscopy; near-field scanning optical microscopy; optical force; opto-mechanics; scanning probe microscopy

Abstract

We demonstrate a new multi-frequency approach for mapping near-field optically induced forces with subwavelength spatial resolution. The concept relies on oscillating a scanning probe at two different frequencies. Oscillations at one frequency are driven electrically to provide positional feedback regulation. Modulations at another frequency are induced optically and are used to measure the mechanical action of the optical field on the probe. Because the measurement is based on locally detecting the force of the electromagnetic radiation acting on the probe, the new method does not require a photodetector to map the radiation distribution and, therefore, can provide true broadband detection of light with a single probe. © 2014 IOP Publishing Ltd.

Publication Date

1-24-2014

Publication Title

Nanotechnology

Volume

25

Issue

3

Number of Pages

-

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1088/0957-4484/25/3/035203

Socpus ID

84896527299 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84896527299

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