Title
Evolution Of Leakage Current Paths In Mc-Si Pv Modules From Leading Manufacturers Undergoing High-Voltage Bias Testing
Keywords
Degradation; high-voltage bias; leakage current; photovoltaic (PV) cells; photovoltaic systems; potential-induced degradation; reliability; system voltage stress
Abstract
The evolution of leakage currents in photovoltaic modules undergoing outdoor high-voltage bias testing is studied using data from high-voltage bias testing of multicrystalline silicon modules from leading manufacturers. An analysis of the module leakage currents as a function of environmental conditions including temperature, relative humidity, rain, and wetness is carried out. The behavior of the modules was found to be dependent on the module construction and the materials used. The Arrhenius model was used to fit the experimental data and activation energies were computed for various relative humidity values. The effect of dew and rain (wetness) on the front glass was investigated. Changes in the leakage current during dry conditions were studied using the temperature dependence of resistivity of bulk soda-lime glass. Because of the approximately tenfold increase in leakage currents during the wet conditions, it is suggested that the accelerated tests should not be limited exclusively to noncondensing environments but should also be complemented with tests that include wet conditions. © 2014 IEEE.
Publication Date
3-1-2014
Publication Title
IEEE Journal of Photovoltaics
Volume
4
Issue
2
Number of Pages
654-658
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/JPHOTOV.2013.2294764
Copyright Status
Unknown
Socpus ID
84897660116 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84897660116
STARS Citation
Dhere, Neelkanth G.; Shiradkar, Narendra S.; and Schneller, Eric, "Evolution Of Leakage Current Paths In Mc-Si Pv Modules From Leading Manufacturers Undergoing High-Voltage Bias Testing" (2014). Scopus Export 2010-2014. 8583.
https://stars.library.ucf.edu/scopus2010/8583