Title
Quantifying Defect Densities In Monolayer Graphene Using Near-Field Coherence Measurements
Abstract
We show that defect density in two-dimensional crystalline lattices determines the extent of near-field spatial coherence. Measurements demonstrate the relationship between the spatial coherence length of scattered light and that of photo-excited electrons in graphene.
Publication Date
7-21-2014
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/FIO.2016.FF5B.3
Copyright Status
Unknown
Socpus ID
85019532574 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85019532574
STARS Citation
Naraghi, Roxana Rezvani; Cançado, Luiz Gustavo; Salazar-Bloise, Félix; and Dogariu, Aristide, "Quantifying Defect Densities In Monolayer Graphene Using Near-Field Coherence Measurements" (2014). Scopus Export 2010-2014. 8809.
https://stars.library.ucf.edu/scopus2010/8809