Title
Nondegenerate Nonlinear Refraction In Semiconductors
Abstract
The dispersion of nondegenerate nonlinear refraction in semiconductors is measured using our beam-deflection method. With high nondegeneracy, n2 is significantly enhanced over the degenerate case, and rapidly switches sign to negative near the bandgap.
Publication Date
7-21-2014
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/FIO.2016.JTh2A.26
Copyright Status
Unknown
Socpus ID
85019530625 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85019530625
STARS Citation
Zhao, Peng; Reichert, Matthew; Hagan, David J.; and Van Stryland, Eric W., "Nondegenerate Nonlinear Refraction In Semiconductors" (2014). Scopus Export 2010-2014. 8811.
https://stars.library.ucf.edu/scopus2010/8811