Title

A Review Of Manufacturing Metrology For Improved Reliability Of Silicon Photovoltaic Modules

Keywords

durability; manufacturing; metrology; PV modules; reliability; Silicon; solar cells

Abstract

In this work, the use of manufacturing metrology across the supply chain to improve crystalline silicon (c-Si) photovoltaic (PV) module reliability and durability is addressed. Additionally, an overview and summary of a recent extensive literature survey of relevant measurement techniques aimed at reducing or eliminating the probability of field failures is presented. An assessment of potential gaps is also given, wherein the PV community could benefit from new research and demonstration efforts. This review is divided into three primary areas representing different parts of the c-Si PV supply chain: (1) feedstock production, crystallization and wafering; (2) cell manufacturing; and (3) module manufacturing.

Publication Date

1-1-2014

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

9179

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.2063781

Socpus ID

84922665536 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84922665536

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