Title

Outdoor Performance Testing Of Thin-Film Pv Modules In The Hot And Humid Climate

Keywords

A-Si:H; CdTe; CIGS; Semiconductor device reliability; Thin film

Abstract

Results from outdoor exposure testing of thin-film PV modules from various US manufacturers are being presented. The modules were deployed in the hot and humid climate of Florida. The duration of the exposure ranged between 21/2 to over 6 years for various technologies. PVUSA type regression analysis was carried out for the continuously measured output power from the PV arrays to study their performance variation with time. Annual energy yield was also determined for the duration of this study. Estimates of performance degradation are provided so as to assist in the compilation of degradation data for the Thin Film PV Module Task Group 8 of International Quality Assurance Task Force. © 2013 IEEE.

Publication Date

1-1-2013

Publication Title

Conference Record of the IEEE Photovoltaic Specialists Conference

Number of Pages

2994-2997

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2013.6745092

Socpus ID

84896484951 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84896484951

This document is currently not available here.

Share

COinS