Title

Structural Study Of Cigs2 Thin Film Absorbers Using Ebsd Technique

Abstract

In this study electron backscatter diffraction (EBSD) investigation is carried out for CuIn 1-xGa XS 2 (CIGS2) samples that were prepared by two stage process in which the initial precursor was deposited by DC magnetron sputtering followed by sulfurization in conventional furnace. Due to high surface roughness, low quality EBSD signal was obtained in the samples that were initially polished with ion milling. Polishing with dimpler grinder followed by chemical treatment with bromine/methanol solution improved the quality of EBSD patterns. Efforts are being made to build the database for CIGS2 in the system using high quality EBSD patterns and finally to obtain grain orientation maps. © 2011 Materials Research Society.

Publication Date

1-1-2012

Publication Title

Materials Research Society Symposium Proceedings

Volume

1323

Number of Pages

163-167

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1557/opl.2011.828

Socpus ID

84455190842 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84455190842

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