In Situ X-Ray Diffraction Studies Of Crystallization Growth Behavior In Zno-Bi2O3-B2O3 Glass As A Route To Functional Optical Devices

Keywords

crystal growth; nucleation &; growth; x-ray diffraction (XRD)

Abstract

Transparent optical ZnO-Bi2O3-B2O3 (ZBB) glass-ceramics were created by the melt quenching technique. In this work, a melt of the glass containing stoichiometric ratios of Zn/Bi/B and As was studied. Differential scanning calorimeter (DSC) measurements was used to measure the thermal behavior. VIS/NIR transmission measurements were used to determine the transmission window. X-ray diffraction (XRD) was used to determine crystal phase. In this study, we explore new techniques and report a detailed study of in-situ XRD of the ZBB composition in order to correlate nucleation temperature, heat treatment temperature, and heat treatment duration with induced crystal phase.

Publication Date

1-1-2018

Publication Title

MRS Advances

Volume

3

Issue

11

Number of Pages

563-567

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1557/adv.2017.640

Socpus ID

85045064253 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85045064253

This document is currently not available here.

Share

COinS