Electroluminescence-Testing Induced Crack Closure In Pv Modules

Keywords

Current measurement Current-voltage characteristics; Electroluminescence; Heating; Photovoltaic cells; Solar Panels; Strain; Stress; Thermal expansion; Waste heat

Abstract

Electroluminescence (EL) measurements of PV modules with cracked cells have showed some open cracks to close arbitrarily from day to day even though these modules are stored in a controlled, stressor free laboratory environment - constant temperature and no mechanical load. We have found that variations in current and temperature generated from resistive heating during EL measurements strongly influence crack closure. Because crack closure can lead to some gain in maximum power, we consider the ramifications for IEC standards, namely that performing EL measurements before I-V measurements may lead to inflated results.

Publication Date

6-1-2019

Publication Title

Conference Record of the IEEE Photovoltaic Specialists Conference

Number of Pages

2252-2258

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC40753.2019.8981398

Socpus ID

85081559045 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85081559045

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