A Thorough Way Of Mapping Efficiency With Photoluminescence

Keywords

Biased-PL; ideality factor; Jsc maps; parameter maps; recombination rate

Abstract

An alternative method to map essential variables like dark saturation current density, series resistance, and the ultimate cell efficiency will be introduced. This approach will combine the terminally connected diode model with the ideality factor map technique modified to a scenario where current is extracted out of the circuitry. Following the delineation of the steps governing the principles of parameter mapping, we elaborate the fidelity that could be gained via improving upon the already existing methods.

Publication Date

12-14-2015

Publication Title

2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2015.7356041

Socpus ID

84961626021 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84961626021

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