Predicting Service Life Of Bypass Diodes In Photovoltaic Modules

Keywords

Bypass Diode; PV Module; Reliability

Abstract

Service life model for bypass diodes is a critical step towards developing service life models for PV modules. A review of failure mechanisms in bypass diodes along with the accelerated tests that could replicate them is presented. Susceptibility of commercially available bypass diodes for thermal runaway was studied. Accelerated tests were performed to study the diode wear out by High Temperature Forward Bias (HTFB) and Thermal Cycling (TC) mechanisms.

Publication Date

12-14-2015

Publication Title

2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2015.7355606

Socpus ID

84961620270 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84961620270

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