Near Field Measurements Of The Scattering Phase Function With Evanescent Field Excitation

Keywords

Microscopy; Mie scattering; Optical scattering; Optical surface waves; Optics

Abstract

Scattering phase functions of spherical particles excited with evanescent waves are measured using near-field optical scanning microscopy. Polarization dependent cross-sections and asymmetry parameters are determined to improve the predictive capabilities of light transport models.

Publication Date

8-10-2015

Publication Title

Conference on Lasers and Electro-Optics Europe - Technical Digest

Volume

2015-August

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

84954065662 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84954065662

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