Temporal Dynamics Of Nonlinear Absorption And Refraction In Crystalline And Hydrogenated Amorphous Silicon

Creator

Akbar Ali Syed, University of Central Florida
Matthew Reichert, University of Central Florida
Trenton R. Ensley, University of Central Florida
Jason Pelc, Hewlett Packard Laboratories
David J. Hagan, University of Central Florida

Abstract

We measure the temporal dynamics of nonlinear absorption (NLA) and refraction (NLR) in crystalline and hydrogenated-amorphous silicon at 1550 nm. The effect of relative polarization on NLA and NLR are also reported.

Publication Date

1-1-2015

Publication Title

Nonlinear Optics, NLO 2015

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/NLO.2015.NTu3A.4

Copyright Status

Unknown

Socpus ID

84945927290 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84945927290

STARS Citation

Syed, Akbar Ali; Reichert, Matthew; Ensley, Trenton R.; Pelc, Jason; and Hagan, David J., "Temporal Dynamics Of Nonlinear Absorption And Refraction In Crystalline And Hydrogenated Amorphous Silicon" (2015). Scopus Export 2015-2019. 1694.
https://stars.library.ucf.edu/scopus2015/1694