Adaptive Mitigation Of Radiation-Induced Errors And Tddb In Reconfigurable Logic Fabrics

Abstract

Self-reliance capabilities of mission-critical systems gain importance as technology scaling and logic capacity of SRAM-based reconfigurable devices increase. The Sustainable Modular Adaptive Redundancy Technique (SMART) is evaluated to optimize the reliability, availability, and energy efficiency of reconfigurable logic devices with a given area footprint. A Monte Carlo driven Continuous Markov Time Chain (CMTC) simulation is conducted to assess availability using runtime adaptation with SMART in comparison to conventional design-time static Triple Modular Redundancy (TMR) techniques. In harsh environments, adaptive redundancy is shown to improve system availability under lengthy repair times, and to a more significant degree under rapid recovery times. When compared to TMR, adaptive redundancy achieves power savings ranging from 22% to 29%, at a reduced area cost ranging from 17% to 24%, while maintaining comparable levels of availability.

Publication Date

7-1-2015

Publication Title

Proceedings - 2015 IEEE 24th North Atlantic Test Workshop, NATW 2015

Number of Pages

23-32

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/NATW.2015.14

Socpus ID

84943744678 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84943744678

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