Cmos Voltage-Controlled Oscillator Resilient Design For Wireless Communication Applications
Keywords
Aging effect; Core power; LC-VCO; Phase noise; Process variation
Abstract
Semiconductor process variation and reliability aging effect on CMOS VCO performance has been studied. A technique to mitigate the effect of process variations on the performances of nano-scale CMOS LC-VCO is presented. The LC-VCO compensation uses a process invariant current source. VCO parameters such as phase noise and core power before and after compensation over a wide range of variability are examined. Analytical equations are derived for physical insight. ADS and Monte-Carlo simulation results show that the use of invariant current source improves the robustness of the VCO performance against process variations and device aging.
Publication Date
1-1-2015
Publication Title
WMSCI 2015 - 19th World Multi-Conference on Systemics, Cybernetics and Informatics, Proceedings
Volume
1
Number of Pages
249-253
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
84961140621 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84961140621
STARS Citation
Kritchanchai, Ekavut and Yuan, Jiann Shiun, "Cmos Voltage-Controlled Oscillator Resilient Design For Wireless Communication Applications" (2015). Scopus Export 2015-2019. 1905.
https://stars.library.ucf.edu/scopus2015/1905