Cmos Voltage-Controlled Oscillator Resilient Design For Wireless Communication Applications

Keywords

Aging effect; Core power; LC-VCO; Phase noise; Process variation

Abstract

Semiconductor process variation and reliability aging effect on CMOS VCO performance has been studied. A technique to mitigate the effect of process variations on the performances of nano-scale CMOS LC-VCO is presented. The LC-VCO compensation uses a process invariant current source. VCO parameters such as phase noise and core power before and after compensation over a wide range of variability are examined. Analytical equations are derived for physical insight. ADS and Monte-Carlo simulation results show that the use of invariant current source improves the robustness of the VCO performance against process variations and device aging.

Publication Date

1-1-2015

Publication Title

WMSCI 2015 - 19th World Multi-Conference on Systemics, Cybernetics and Informatics, Proceedings

Volume

1

Number of Pages

249-253

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

84961140621 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84961140621

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