Title
Editorial
Publication Date
1-1-2015
Publication Title
Microelectronics Reliability
Volume
55
Issue
11
Number of Pages
2173-
Document Type
Editorial Material
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.microrel.2015.09.033
Copyright Status
Unknown
Socpus ID
84951320295 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84951320295
STARS Citation
Liou, Juin J.; Lin, Chun Chieh; and Lin, Chu Hsuan, "Editorial" (2015). Scopus Export 2015-2019. 2111.
https://stars.library.ucf.edu/scopus2015/2111
COinS