Stress Test Of Lithographic Vertical-Cavity Surface-Emitting Lasers Under Extreme Operating Conditions

Abstract

Reliability test data are presented, which show that non-oxide all-lithographic vertical-cavity surface-emitting lasers (VCSELs) are more reliable than oxide VCSELs under extreme operating conditions. The test data are compared for lithographic and oxide VCSELs of 3 μm size after operating at a stage temperature of 150°C and an injection current density of 140 kA/cm2 for various times. The increased reliability under extreme operating conditions can be largely attributed to the lower junction temperature and the internal stress inside lithographic VCSELs.

Publication Date

8-6-2015

Publication Title

Electronics Letters

Volume

51

Issue

16

Number of Pages

1279-1280

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1049/el.2015.1385

Socpus ID

84938583831 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84938583831

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