Quantitative Microstructural Imaging By Scanning Laue X-Ray Micro- And Nanodiffraction

Keywords

crystallographic structure; phase transformation; x-ray diffraction (XRD)

Abstract

Local crystal structure, crystal orientation, and crystal deformation can all be probed by Laue diffraction using a submicron x-ray beam. This technique, employed at a synchrotron facility, is particularly suitable for fast mapping the mechanical and microstructural properties of inhomogeneous multiphase polycrystalline samples, as well as imperfect epitaxial films or crystals. As synchrotron Laue x-ray microdiffraction enters its 20th year of existence and new synchrotron nanoprobe facilities are being built and commissioned around the world, we take the opportunity to overview current capabilities as well as the latest technical developments. Fast data collection provided by state-of-the-art area detectors and fully automated pattern indexing algorithms optimized for speed make it possible to map large portions of a sample with fine step size and obtain quantitative images of its microstructure in near real time. We extrapolate how the technique is anticipated to evolve in the near future and its potential emerging applications at a free-electron laser facility.

Publication Date

6-8-2016

Publication Title

MRS Bulletin

Volume

41

Issue

6

Number of Pages

445-453

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1557/mrs.2016.97

Socpus ID

84973873293 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84973873293

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