Low-Noise Amplifier Reliability

Abstract

This chapter talks about low-noise amplifier performance degradation subjected to hot electron effect. In addition to physical explantions, analytical equations and experimental data are provided.

Publication Date

1-1-2016

Publication Title

SpringerBriefs in Applied Sciences and Technology

Issue

9789811008825

Number of Pages

11-18

Document Type

Article; Book Chapter

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/978-981-10-0884-9_3

Socpus ID

85027691564 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85027691564

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