Optical Loss Analysis Of Silicon Solar Cells Using Spatial Resolved Quantum Efficiency And Reflectance Measurements

Abstract

IQE data has long been a key analysis tool for c-Si cell research. Transitioning from single point measurements to spatially resolved measurements allows for the detailed analysis of quality and uniformity of the processes and materials used in cell manufacturing. This work explores how spatially resolved reflectance data can be analyzed to provide valuable information regarding the front surface texturing, rear surface properties, and ARC properties of completed solar cells.

Publication Date

11-18-2016

Publication Title

Conference Record of the IEEE Photovoltaic Specialists Conference

Volume

2016-November

Number of Pages

2515-2517

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2016.7750099

Socpus ID

85003545095 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85003545095

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