Calculating The Costs And Benefits Of Metrology: A Case Study

Abstract

In this work, we present a transparent and relatively simple method of calculating the economic viability of a given metrology technique using a case study in crystalline silicon photovoltaic (PV) cell manufacturing. The case study used here is the in-line measurement of implied open-circuit voltage of wafers following the deposition of front and rear side passivation films, which occurs before screen-printing and firing when manufacturing rear passivated PV cells. Cost-benefit calculations are performed using a new freeware tool on the PV Lighthouse website. Here, we show the wafer rejection threshold point selected and the cost of the metrology have a strong influence on the ultimate profitability.

Publication Date

11-18-2016

Publication Title

Conference Record of the IEEE Photovoltaic Specialists Conference

Volume

2016-November

Number of Pages

3495-3498

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2016.7750318

Socpus ID

85003601627 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85003601627

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