Far-Infrared Absorber Based On Standing-Wave Resonances In Metal-Dielectric-Metal Cavity

Abstract

Thin-film resonant absorbers for the far-IR spectral range were fabricated, characterized, and modeled. The 3-μm-thick structure comprises a periodic surface array of metal squares, a dielectric spacer and a metallic ground plane. Up to 95% absorption for the fundamental band at ∼53.5μm wavelength (5.6 THz) is achieved experimentally. Absorption bands are independent of the structure period and only weakly dependent on polarization and incident angle. The results are well explained in terms of standing-wave resonances within individual metal-dielectric-metal cavities. The structure has application as a wavelength selective coating for far-IR bolometers.

Publication Date

8-10-2015

Publication Title

Optics Express

Volume

23

Issue

16

Number of Pages

20366-20380

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/OE.23.020366

Socpus ID

84957037968 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84957037968

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