Integration Of Spatially Resolved Ideality Factor Into Local Cell Efficiency Analysis With Photoluminescence
Keywords
Biased-photoluminescence; Crystalline silicon photovoltaic cells; Efficiency mapping; Ideality factor
Abstract
An alternative method to image essential variables like dark saturation current density, series resistance, and cell efficiency is introduced in this work. This approach combines the terminally connected diode model with a modified technique for extracting the spatially resolved ideality factor of the cell under non-open-circuit conditions. Following a description of the steps governing the principles of this parameter imaging approach, we explore potential benefits of this technique and how it may improve upon existing methods.
Publication Date
12-1-2017
Publication Title
Solar Energy
Volume
158
Number of Pages
869-874
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.solener.2017.10.006
Copyright Status
Unknown
Socpus ID
85032026974 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85032026974
STARS Citation
Öğütman, Kortan; Davis, Kristopher O.; Schneller, Eric; Yelundur, Vijay; and Schoenfeld, Winston V., "Integration Of Spatially Resolved Ideality Factor Into Local Cell Efficiency Analysis With Photoluminescence" (2017). Scopus Export 2015-2019. 6249.
https://stars.library.ucf.edu/scopus2015/6249