Title
Electronic Structure And Ultrafast Charge Carrier Dynamics Of Zn Clusters Supported On A P-Si(100) Surface
Abstract
Femtosecond XUV photoemission spectroscopy is employed to monitor the non-metal to metal transition of Zn clusters grown on p-Si(100) as well as the ultrafast charge migration, trapping, and recombination at the surface.
Publication Date
1-1-2017
Publication Title
Optics InfoBase Conference Papers
Volume
Part F68-LS 2017
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/LS.2017.LTu4F.4
Copyright Status
Unknown
Socpus ID
85035097385 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85035097385
STARS Citation
Vaida, Mihai E.; Marsh, Brett M.; Lamoureux, Bethany; and Leone, Stephen R., "Electronic Structure And Ultrafast Charge Carrier Dynamics Of Zn Clusters Supported On A P-Si(100) Surface" (2017). Scopus Export 2015-2019. 6767.
https://stars.library.ucf.edu/scopus2015/6767