Work Function Extraction Of Indium Tin Oxide Used As Transparent Gate Electrode For Mosfet
Abstract
Recent commercialization has increased the research interest in transparent conducting oxides like Indium Tin Oxide (ITO) being implemented in display technologies and sensors. RF sputtered ITO is used as a transparent gate electrode to fabricate n-MOSFET. For the fabrication of the MOSFET, a four-level mask is used. Electrical characterization is performed on these MOSFETs. Work function (WI) of ITO is extracted from the threshold voltage measurements of the MOSFET devices. A new method of extracting work function of ITO from n-MOSFET device is introduced in this study.
Publication Date
1-1-2017
Publication Title
ECS Transactions
Volume
77
Issue
11
Number of Pages
1905-1910
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1149/07711.1905ecst
Copyright Status
Unknown
Socpus ID
85030548741 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85030548741
STARS Citation
Nehate, S. D. and Sundaram, K. B., "Work Function Extraction Of Indium Tin Oxide Used As Transparent Gate Electrode For Mosfet" (2017). Scopus Export 2015-2019. 7044.
https://stars.library.ucf.edu/scopus2015/7044