Ultrafast Dynamics Of Nonlinear Refraction

Creator

David J. Hagan, University of Central Florida
Eric W. Van Stryland, University of Central Florida

Abstract

We introduce the nonlinear beam deflection technique that allows unambiguous separation of slow and fast nonlinearities. This highly sensitive method allowed characterization of a wide range of materials, including solvents, gases, semiconductors and transparent conducting oxides.

Publication Date

1-1-2018

Publication Title

Optics InfoBase Conference Papers

Volume

Part F123-LAOP 2018

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/LAOP.2018.W2E.1

Copyright Status

Unknown

Socpus ID

85059476323 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85059476323

STARS Citation

Hagan, David J. and Van Stryland, Eric W., "Ultrafast Dynamics Of Nonlinear Refraction" (2018). Scopus Export 2015-2019. 7942.
https://stars.library.ucf.edu/scopus2015/7942