Qualitative Analysis Of Single Shot Ablation Craters With Ultra-Short Pulses

Keywords

Conductors; Femtosecond; Laser Ablation; Nanosecond; Semi-Conductors; Single Shot

Abstract

This work compares the effects of ablation on GaAs, Al, and Ti samples exposed to two different regimes: a focused 800nm, 14.13mJ pulse of 55fs duration from a Ti: Sapphire laser with an intensity of 2×1016 W cm-2 and a focused 1064nm, 14.61mJ pulse of 10ns duration from a Nd: YAG laser with an intensity of 2×1010 W cm-2. The craters are examined using optical microscopy, white light interferometry, and scanning electron microscopy. Among the effects examined in this paper are the conduction of energy throughout the material, formation of nanodroplets outside of the crater, nanopits in the center of the crater, and the effects of phase explosion inside the crater.

Publication Date

1-1-2018

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

10522

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.2290351

Socpus ID

85048532878 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85048532878

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