Intrinsic detection of scattering phase with near-field scanning optical microscope
Abbreviated Journal Title
CONTRAST; PROBES; Optics
We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM. (C) 2010 Optical Society of America
"Intrinsic detection of scattering phase with near-field scanning optical microscope" (2010). Faculty Bibliography 2010s. 375.