Intrinsic detection of scattering phase with near-field scanning optical microscope

    Authors

    D. C. Kohlgraf-Owens; D. Haefner; S. Sukhov;A. Dogariu

    Comments

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    Abbreviated Journal Title

    Opt. Lett.

    Keywords

    CONTRAST; PROBES; Optics

    Abstract

    We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM. (C) 2010 Optical Society of America

    Journal Title

    Optics Letters

    Volume

    35

    Issue/Number

    14

    Publication Date

    1-1-2010

    Document Type

    Article

    Language

    English

    First Page

    2463

    Last Page

    2465

    WOS Identifier

    WOS:000279994400050

    ISSN

    0146-9592

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