Keywords
Minority carrier transport; Gallium oxide; Gallium nitride; Radiation damage; Electron injection
Abstract
This study investigates the minority carrier transport properties of wide bandgap semiconductors, primarily gallium oxide (Ga2O3) and gallium nitride (GaN). Ga2O3 is an emerging ultra-wide bandgap semiconductor with applications in high temperature electronics and sensors for use in extreme environments. Ga2O3 is a suitable material for devices deployed in the lower Earth satellite orbits due to its intrinsic radiation hardness, applications in solar-blind ultraviolet (UV) detection, and high power/high frequency electronics. The main factor limiting Ga2O3 technology so far is the reliable high mobility p-type Ga2O3; however, recent advances have shown a promising future for developments in this direction. Minority carrier transport properties such as minority carrier diffusion length (L) and lifetime (t) are of vital importance with the advent of p-type conductivity, as they are the limiting factor in the performance of bipolar devices. In this thesis, a comparison of the temperature dependence of L, t, and CL emission in n-type Si-doped Ga2O3 Schottky rectifiers, exposed to 18 MeV alpha particles and 10 MeV protons is presented. Additionally, the effect of electron injection, a countermeasure to in-situ mitigates the radiation damage, is studied in these structures. Electron injection has also been found to enhance L and t in unintentionally doped GaN. Lastly, the temperature dependence of minority carrier diffusion length and CL emission is presented in the novel p-type Ga2O3.
Notes
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Graduation Date
2022
Semester
Spring
Advisor
Chernyak, Leonid
Degree
Doctor of Philosophy (Ph.D.)
College
College of Sciences
Department
Physics
Degree Program
Physics
Format
application/pdf
Identifier
CFE0009450; DP0027173
URL
https://purls.library.ucf.edu/go/DP0027173
Language
English
Release Date
November 2025
Length of Campus-only Access
3 years
Access Status
Doctoral Dissertation (Campus-only Access)
Subjects
Metal oxide semiconductors--Effect of radiation on; Semiconductors--Effect of radiation on; Gallium nitride--Electric properties; Diodes, Schottky-barrier--Effect of radiation on; Wide gap semiconductors
STARS Citation
Modak, Sushrut, "Impact of Electron Injection and Radiation Damage on Minority Carrier Transport Properties in Gallium Oxide and Gallium Nitride" (2022). Electronic Theses and Dissertations, 2020-2023. 1479.
https://stars.library.ucf.edu/etd2020/1479
Restricted to the UCF community until November 2025; it will then be open access.