Keywords

Metrology, Refractometry, Infrared, Materials

Abstract

New optical designs have necessitated using refractive index data that is accurate to the third and fourth decimal points. Prism coupling refractometry could be attractive for this task because of a combination of factors. It allows for a direct assessment of the refractive index like interferometry or the minimum deviation method while being quick and convenient, like Kramers-Krönig analysis and spectroscopic ellipsometry. However, the accuracy, precision, and repeatability of this technique have not been revisited recently in the literature. This thesis seeks to identify the critical features of this technique that define its uncertainties and then provides some initial improvements to this system. The improvements explored are hardware-based and incorporate a novel approach to fitting this data. The resulting error budget defined by this strategy increases the measured precision, taking the first step towards making the method a standard metrology technique suitable for the shop floor.

Completion Date

2023

Semester

Fall

Committee Chair

Richardson, Kathleen ; Gaume, Romain

Degree

Master of Science (M.S.)

College

College of Optics and Photonics

Format

application/pdf

Identifier

DP0028455

Language

English

Release Date

June 2024

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Campus Location

Orlando (Main) Campus

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