Analysis Of The Validity Of Methods For Extracting The Effective Channel Length Of Short-Channel Ldd Mosfets

Authors

Authors

Z. Latif; J. J. Liou; A. OrtizConde; F. J. G. Sanchez; W. Wang;Y. G. Chen

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Solid-State Electron.

Keywords

Engineering, Electrical & Electronic; Physics, Applied; Physics, ; Condensed Matter

Journal Title

Solid-State Electronics

Volume

39

Issue/Number

7

Publication Date

1-1-1996

Document Type

Article

DOI Link

http://dx.doi.org/10.1016/0038-1101(95)00421-1

Language

English

First Page

1093

Last Page

1094

WOS Identifier

WOS:A1996UU39400022

ISSN

0038-1101

Recommended Citation

"Analysis Of The Validity Of Methods For Extracting The Effective Channel Length Of Short-Channel Ldd Mosfets" (1996). Faculty Bibliography 1990s. 3047.
https://stars.library.ucf.edu/facultybib1990/3047