Title
Analysis Of The Validity Of Methods For Extracting The Effective Channel Length Of Short-Channel Ldd Mosfets
Abbreviated Journal Title
Solid-State Electron.
Keywords
Engineering, Electrical & Electronic; Physics, Applied; Physics, ; Condensed Matter
Journal Title
Solid-State Electronics
Volume
39
Issue/Number
7
Publication Date
1-1-1996
Document Type
Article
Language
English
First Page
1093
Last Page
1094
WOS Identifier
ISSN
0038-1101
Recommended Citation
"Analysis Of The Validity Of Methods For Extracting The Effective Channel Length Of Short-Channel Ldd Mosfets" (1996). Faculty Bibliography 1990s. 3047.
https://stars.library.ucf.edu/facultybib1990/3047
COinS
Comments
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