Title

Array Noise-Analysis For Multimegabit Dram Design

Authors

Authors

J. S. Yuan;J. J. Liou

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Int. J. Electron.

Keywords

Engineering, Electrical & Electronic

Abstract

An analytical model for bit-line coupling noise in various DRAM architectures has been developed. The analytical expressions developed provide insight into the charge redistribution when the word lines turn on. They are also useful for determining the noise-to-signal ratio and for designing the sense amplifier circuit. Noise extracted from SPICE circuit simulation is included and is compared against the results from the present analytical model. Good agreement is found.

Journal Title

International Journal of Electronics

Volume

74

Issue/Number

2

Publication Date

1-1-1993

Document Type

Article

Language

English

First Page

265

Last Page

279

WOS Identifier

WOS:A1993KQ79800010

ISSN

0020-7217

Share

COinS